Joint simulation method for ultra-wideband electromagnetic pulse irradiation effect on a certain type of anti-tank missile fuze

Authors

  • Rong He
  • Chenyang Zhang
  • Shuai Chen
  • Xiangjin Zhang

DOI:

https://doi.org/10.56028/aetr.15.1.670.2025

Keywords:

Ultra-wideband EMP; PMOS; Negative Bias Temperature Instability.

Abstract

Taking a certain type of anti-tank missile all-electronic safety system as the research object, based on the existing fuse model and circuit, using different simulation software to establish the excitation source and device model that meets the requirements, and using the joint simulation method to establish a complete simulation system from ‘field’ to ‘device’ for the effect of the ultra-wideband electromagnetic pulse. Using the joint simulation method, a complete simulation system from ‘field’ to ‘device’ is established for the ultra-wideband electromagnetic pulse effect. The field strength of the external interference source in the battlefield environment is analyzed, and the field strength radiated in the cavity through the coupling path. The establishment of the semiconductor device electro-thermal simulation model, the study of the electromagnetic pulse injection on the internal sensitive devices caused by the loss mechanism and the cause of failure, the use of the joint simulation method in a comprehensive assessment of a certain type of anti-tank missile fuzes in the ultra-broadband electromagnetic pulse irradiation capacity at the same time, but also accurately understand the fuse system in the most susceptible to the impact of the ultra-broadband electromagnetic pulse in the part of the protective measures to provide guidance.

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Published

2025-12-10