Photolithography-Based Manufacturing for Next-Generation Microelectronics

Authors

  • Yang Wang

DOI:

https://doi.org/10.56028/aetr.15.1.1801.2025

Keywords:

Photolithography; Extreme Ultraviolet Lithography (EUV); Semiconductor Manufacturing; Moore's Law; Computational Lithography.

Abstract

Photolithography has become the cornerstone of modern microelectronics fabrication, enabling the production of highly complex integrated circuits with nanometer-scale precision. This paper provides a comprehensive overview of photolithography, highlighting its historical development, core mechanisms, recent technological advancements, and the challenges associated with continued device scaling. The study analyzes resist chemistry, optical systems, extreme ultraviolet lithography (EUVL), and multiple-patterning strategies. In addition, the paper examines the economic and industrial implications of adopting new lithographic techniques and considers the future trajectory of this critical manufacturing process. The findings suggest that while EUVL represents a transformative advancement, complementary progress in resist chemistry, optical engineering, and computational lithography is required to sustain innovation. The work contributes to ongoing discussions regarding the sustainability of Moore’s law and the semiconductor industry's future.

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Published

2025-11-20